Tallinn University of Technology

CRASHLESS

Table of Contents

Objectives

PRG1467 "CRASHLESS - Cross-Layer Reliability and Self-Health Awareness for Intelligent Autonomous Systems " (01.01.2022−31.12.2026); Principal Investigator: Maksim Jenihhin; Tallinn University of Technology, School of Information Technologies, Department of Computer Systems; Financier: Estonian Research Council

CRASHLESS aims at radically new cross-layer reliability and self-health awareness technology for tomorrow's intelligent autonomous systems and IoT edge devices in Estonia and EU. The enormous complexity of today's advanced cyber-physical systems and systems of systems is multiplied by their  heterogeneity and the emerging computing architectures employing AI-based autonomy. The setups, such as autonomous swarms of robotic vehicles, are already on the doorstep and call for novel approaches for reliability across all the layers. Continuous self-health awareness and infrastructure for in-field self-healing are becoming an enabling factor for new IoT edge devices and systems on the way to market. The new deep-tech by CRASHLESS equips engineers with design-phase solutions and in-field instruments for industry-scale systems and, ultimately, facilitates the user experience of the system’s crashless operation. The results are to be validated in close collaboration with Estonian companies. 

ETIS

Objective 1.  

To develop radically new cross-layer reliability management and a self-health awareness technology for the intelligent autonomous systems practically applicable by Estonian and EU industry in the short-term and mid-term future. The CRASHLESS technology is aimed to tackle the challenge by both: 

a) design-phase cross-layer reliability enhancement  

b) in-field intelligent fault resilience for industry-scale systems. 

Objective 2.  

To establish a new sustainable research group for strengthening the national competence in cross-layer reliability and self-health awareness in intelligent autonomous systems and IoT edge devices. The group will be a base for consultancy and collaboration for Estonian technological companies and also governmental authorities. In particular, the project aims at establishing an accessible Knowledge Pool and cross-sectoral MSc and PhD training. 

Supervised dissertations

Mahdi Taheri - Methods for Reliability Assessment and Enhancement of Deep Neural Network Hardware Accelerators
Supervisor: Maksim Jenihhin; Masoud Daneshtalab      Defended: 2025

Ahmet Cagri Bagbaba - Methods to Optimize Functional Safety Assessment for Automotive Integrated Circuits
Supervsor: Maksim Jenihhin; CHRISTIAN SAUER            Defended: 2022

Aneesh Balakrishnan - A Synthetic, Hierarchical Approach for Modelling and Managing Complex Systems' Quality and Reliability
Supervsor: Maksim Jenihhin; Dan Alexandrescu           Defended: 2022

Xinhui Lai - Approaches to Extra-Functional Verification of Security and Reliability Aspects in Hardware Designs
Supervsor: Maksim Jenihhin; Jaan Raik                         Defended: 2022

Supervision of postdoctoral researchers

The work of the postdocs contributed to the CRASHLESS concepts.


01.08.2021−31.08.2023
Foisal AHMED "Cross-layer reliability of UAV computing platforms"
Prime University, Bangladesh

01.11.2020−31.10.2022
Dadmehr Rahbari  "Optimization of Collaborative Computing for MEC in Dynamic Networks"
University of Qom, Qom, Iran

Dissertations under supervision

Natalia Cherezova - Cross-Layer Reliability and Self-Health Awareness for Intelligent Autonomous Systems
Supervisor: Maksim Jenihhin; Artur Jutman

Rama Mounika Kodamanchili - Pre-silicon validation of AI chips
Supervisor: Maksim Jenihhin

Ahsan Rafiq - Hardware Inference Engines for EDGE AI
Supervisor: Maksim Jenihhin

Publications

coming soon

Rahbari, Dadmehr; Daneshtalab, Masoud; Jenihhin, Maksim (2025). An Efficient Architecture for Edge AI Federated Learning with Homomorphic Encryption. IEEE Access, 97919−97929. DOI: 10.1109/ACCESS.2025.3576689.

Shibin, K.; Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A.; Dierlamm, A.; Dragicevic, M.; Gholami, A.; Gomez, G.; Guthoff, M.; Haranko, M.; Homna, A.; Jenihhin, M.; Kaplon, J.; Karacheban, O.; Korcsmáros, B.; Lokhovitskiy, A.; Loos, R.; Mallows, S.; Michel, J.; Myronenko, V. ... Wegrzyn, G.J. (2025). Electronics design and testing of the CMS Fast Beam Condition Monitor for HL-LHC. Proceedings of Science, 468: Technology & Instrumentation in Particle Physics (TIPP2023), Cape Town, Western Cape, South Africa, 4 - 8 Sep 2023.  Sissa Medialab Srl, ARTN 063. DOI: 10.22323/1.468.0063.

Jenihhin, M.; Raik, J.; Jutman, A.; Cherezova, N.; Ubar, R.; Miclea, L.; Enyedi, S.; Stefan, I.; Stan, O.; Corches, C.; Peng, Z.; Eles, P.; Drechsler, R.; Eggersgluss, S.; Fey, G.; Glowatz, A.; Tille, D.; Gielen, G.; Coyette, A.; Dobbelaere, W. ... Hellebrand, S. (2025). European Test Symposium Teams: an Anniversary Snapshot. 2025 IEEE European Test Symposium (ETS): Tallinn, ESTONIA, 26-30 May 2025.  New York: IEEE, 1−48. (Proceedings of the European Test Symposium). DOI: 10.1109/ETS63895.2025.11049652.

Kadlecsik, A.; Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A. E.; Delannoy, A. G.; Dalavi, V.; Dienemann, N.; Dragicevic, M.; Garcia, M. F.; Guthoff, M.; Jenihhin, M.; Kaplon, J.; Karacheban, O.; Korcsmaros, B.; Lokhovitskiy, A.; Liu, W. H.; Loos, R.; Mallows, S.; Mihhailov, D.; Obradovic, M. ... Winney, P. D. (2025). Characterization and beam test measurements of CMS Phase-2 luminometers. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators Spectrometers Detectors and Associated Equipment, 1080,  ARTN 170663. DOI: 10.1016/j.nima.2025.170663.

Rafiq, Ahsan; Jenihhin, Maksim (2025). XMULT: An Energy-Efficient Design of Approximate Multiplier. 2025 55th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W): Naples, Italy, 23-26 June 2025.  IEEE , 111−114. DOI: 10.1109/DSN-W65791.2025.00047.

Nazari, S.; Taheri, M.; Azarpeyvand, A.; Afsharchi, M.; Herglotz, C.; Jenihhin, M. (2025). GENIE: GENetIc Algorithm-Based REliability Assessment Methodology for Deep Neural Networks. 2025 11th International Conference on Computing and Artificial Intelligence (ICCAI): Kyoto, Japan, 28-31 March 2025.  Institute of Electrical and Electronics Engineers Inc, 264−271. DOI: 10.1109/ICCAI66501.2025.00049.

Sharifian, Saeed; Taheri, Mahdi; Rashtchi, Vahid; Azarpeyvand, Ali; Herglotz, Christian; Jenihhin, Maksim (2025). Reliability-Aware Hyperparameter Optimization for ANN-to-SNN Conversion. Works in Progress in Embedded Computing Journal WiPiEC Journal, 11 (1),  1−7. DOI: 10.64552/wipiec.v11i1.85.

Cherezova, Natalia; Jutman, Artur; Jenihhin, Maksim (2025). FORTALESA: Fault-tolerant reconfigurable systolic array for DNN inference. Microprocessors and Microsystems, 119,  105222. DOI: 10.1016/j.micpro.2025.105222.

Taheri, Mahdi; Patne, Parth; Cherezova, Natalia; Mahani, Ali; Herglotz, Christian; Jenihhin, Maksim (2025). RL-Agent-based Early-Exit DNN Architecture Search Framework. 2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): Lyon, FRANCE, 05-07 May 2025.  Ed. Bosio, A.; Bernardi, P.; Traiola, M.; Mrazek, V. New York: IEEE, 145−148. (IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems). DOI: 10.1109/DDECS63720.2025.11006795.

Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A. E.; Delannoy, A. G.; Dalavi, V.; Dienemann, N.; Dragicevic, M.; Garcia, M. F.; Guthoff, M.; Gyongyosi, B.; Jenihhin, M.; Kadlecsik, A.; Kaplon, J.; Karacheban, O.; Korcsmaros, B.; Lokhovitskiy, A.; Liu, W. H.; Loos, R.; Mallows, S.; Mihhailov, D. ... Winney, P. D. (2025). The CMS Phase-2 Fast Beam Condition Monitor prototype test with beam. Journal of Instrumentation, 20 (11),  ARTN P11008. DOI: 10.1088/1748-0221/20/11/P11008.

Jenihhin, M.; Taheri, M.; Cherezova, N.; Ahmadilivani, M.H.; Selg, H.; Jutman, A.; Shibin, K.; Tsertov, A.; Devadze, S.; Kodamanchili, R.M.; Rafiq, A.; Raik, J.; Daneshtalab, M. (2024). Keynote: Cost-Efficient Reliability for Edge-AI Chips. Keynote: Cost-Efficient Reliability for Edge-AI Chips. IEEE, 2. DOI: 10.1109/LATS62223.2024.10534610.

Rahbari, Dadmehr; Ahmed, Foisal; Jenihhin, Maksim; Alam, Muhammad Mahtab; Le Moullec, Yannick (2024). Reliability-Critical Computation Offloading in UAV Swarms. IEEE Systems Journal, 18 (4), 1871−1882. DOI: 10.1109/JSYST.2024.3432449.

Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A.; Delannoy, A. G.; Dierlamm, A.; Dragicevic, M.; Gholami, A.; Gomez, G.; Guthoff, M.; Haranko, M.; Homna, A.; Jenihhin, M.; Kaplon, J.; Karacheban, O.; Korcsmaros, B.; Liu, W. H.; Lokhovitskiy, A.; Loos, R.; Mallows, S.; Michel, J. ... Wegrzyn, G. J. (2024). The CMS Fast Beam Condition Monitor for HL-LHC. Journal of Instrumentation, 19 (3), ARTN C03048. DOI: 10.1088/1748-0221/19/03/C03048.

Jenihhin, Maksim; Taheri, Mahdi; Cherezova, Natalia; Ahmadilivani, Mohammad Hasan; Rafiq, Ahsan; Raik, Jaan; Daneshtalab, Masoud. (2024). Techniques for Reliability in Edge-AI Chips. IEEE Top Picks in Test and Reliability Workshop at the International Test Conference 2024, San Diego, US, November 7-8, 2024. IEEE Top Picks in Test and Reliability Workshop at the International Test Conference 2024, 1−2.

Ubar, Raimund; Raik, Jaan; Jenihhin, Maksim; Jutman, Artur (2024). Structural Decision Diagrams in Digital Test. Springer Nature Switzerland AG 2024. DOI: 10.1007/978-3-031-44734-1.

Ahmed, Foisal; Jenihhin, Maksim (2024). Cross-layer Bayesian Network for UAV Health Monitoring. 2024 2Nd International Conference On Unmanned Vehicle Systems-Oman, Uvs: 2nd International Conference on Unmanned Vehicle Systems (UVS-Oman), FEB 12-14, 2024, Muscat, OMAN. Ed. Al-Hashim, A.; Pervez, T.; Khriji, L.; Waris, MB. New York: IEEE, 1−7. DOI: 10.1109/UVS59630.2024.10467174.

Cherezova, Natalia; Pappalardo, Salvatore; Taheri, Mahdi; Ahmadilivani, Mohammad Hasan; Deveautour, Bastien; Bosio, Alberto; Raik, Jaan; Jenihhin, Maksim (2024). Heterogeneous Approximation of DNN HW Accelerators based on Channels Vulnerability. 2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC). IEEE, 1−4. DOI: 10.1109/VLSI-SoC62099.2024.10767798.

Cherezova, Natalia; Jenihhin, Maksim; Jutman, Artur (2024). IJTAG-compatible Symptom-based SEU Monitors for FPGA DNN Accelerators. 2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS). IEEE, 1−6. DOI: 10.1109/DTTIS62212.2024.10780417.

Taheri, Mahdi; Cherezova, Natalia; Nazari, Samira; Azarpeyvand, Ali; Ghasempouri, Tara; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim (2024). AdAM: Adaptive Approximate Multiplier for Fault Tolerance in DNN Accelerators. IEEE Transactions on Device and Materials Reliability, 1−11. DOI: 10.1109/TDMR.2024.3523386.

Nazari, Samira; Taheri, Mahdi; Azarpeyvand, Ali; Afsharchi, Mohsen; Ghasempouri, Tara; Herglotz, Christian; Daneshtalab, Masoud; Jenihhin, Maksim (2024). FORTUNE: A Negative Memory Overhead Hardware-Agnostic Fault TOleRance TechniqUe in DNNs. Proceedings of 33rd IEEE Asian Test Symposium: 33rd IEEE Asian Test Symposium. IEEE, 1−6. DOI: 10.36227/techrxiv.173143099.94285566/v1.

Rafiq, A.; Jenihhin, M. (2024). An optimized design of delay-and energy-efficient Booth multiplier. e-Prime - Advances in Electrical Engineering Electronics and Energy, 9, 1−10. DOI: 10.1016/j.prime.2024.100698.

Taheri, Mahdi; Cherezova, Natalia; Ansari, Mohammad Saeed; Jenihhin, Maksim; Mahani, Ali; Daneshtalab, Masoud; Raik, Jaan (2024). Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators. 2024 25Th International Symposium On Quality Electronic Design, Isqed 2024: 25th International Symposium on Quality Electronic Design (ISQED), APR 03-05, 2024, San Francisco, CA. New York: IEEE, 1−7. (International Symposium on Quality Electronic Design). DOI: 10.1109/ISQED60706.2024.10528372.

Taheri, Mahdi; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim; Pappalardo, Salvatore; Jimenez, Paul; Deveautour, Bastien; Bosio, Alberto (2024). SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators. 2024 27Th International Symposium On Design & Diagnostics Of Electronic Circuits & Systems, Ddecs: 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS), APR 03-05, 2024, Kielce, POLAND. Ed. Deniziak, S.; Sitek, P.; Jenihhin, M.; Steininger, A.; Scholzel, M.; Mrazek, V. New York: IEEE, 19−24. (IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems). DOI: 10.1109/DDECS60919.2024.10508925.

Selg, Hardi; Shibin, Konstantin; Tsertov, Anton; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan (2024). Special Session: In-Field ML-Assisted Intermittent Fault Localization and Management in RISC-V SoCs. 2024 37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems: DFT’24, Didcot, United Kingdom, October 8th - 10th , 2024. IEEE, 1−6. DOI: 10.1109/DFT63277.2024.10753541.

Ahmadilivani, M.H.; Bosio, A.; Deveautour, B.; Dos Santos, F.F.; Guerrero-Balaguera, J.D.; Jenihhin, M.; Kritikakou, A.; Sierra, R.L.; Pappalardo, S.; Raik, J.; Condia, J.E.R.; Reorda, M.S.; Taheri, M.; Traiola, M. (2024). Special Session: Reliability Assessment Recipes for DNN Accelerators. Proceedings of the IEEE VLSI Test Symposium. IEEE, 1−7. DOI: 10.1109/VTS60656.2024.10538707.

Taheri, M.; Cherezova, N.; Nazari, S.; Rafiq, A.; Azarpeyvand, A.; Ghasempouri, T.; Daneshtalab, M.; Raik, J.; Jenihhin, M. (2024). AdAM: Adaptive Fault-Tolerant Approximate Multiplier for Edge DNN Accelerators. Proceedings of the European Test Symposium. IEEE, 4. DOI: 10.1109/ETS61313.2024.10567161.

Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim (2024). A Systematic Literature Review on Hardware Reliability Assessment Methods for Deep Neural Networks. ACM Computing Surveys, 56 (6), ARTN 141. DOI: 10.1145/3638242.

Cherezova, Natalia; Shibin, Konstantin; Jenihhin, Maksim; Jutman, Artur (2023). Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications. Microelectronics Reliability, 146, 115010. DOI: 10.1016/j.microrel.2023.115010.

Shibin, Konstantin; Jenihhin; Maksim; Jutman, Artur; Devadze; Sergei; Tsertov, Anton (2023). On-Chip Sensors Data Collection and Analysis for SoC Health Management. 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2023: Juan-Les-Pins, France, 3-5.10.2023. IEEE, 1−6. DOI: 10.1109/DFT59622.2023.10313562.

Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; (2023). Special Session: Approximation and Fault Resiliency of DNN Accelerators. 2023 IEEE 41st VLSI Test Symposium (VTS): San Diego, CA, USA, 24-26 April 2023. IEEE, 1−10. DOI: 10.1109/VTS56346.2023.10140043.

Taheri, Mahdi; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Raik, Jaan; Daneshtalab, Masoud (2023). APPRAISER: DNN Fault Resilience Analysis Employing Approximation Errors. In: 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Tallinn, Estonia. (124−127). IEEE. DOI: 10.1109/DDECS57882.2023.10139468.

Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim (2023). DeepVigor: VulnerabIlity Value Ranges and Factors for DNNs’ Reliability Assessment. In: 28th IEEE European Test Symposium (ETS), Venice, Italy, May 22-26, 2023. (1−6). IEEE. DOI: 10.1109/ETS56758.2023.10174133.

Lai, Xinhui; Jenihhin, Maksim (2023). Analyzing Side-Channel Attack Vulnerabilities at RTL. 2023 Ieee 24Th Latin American Test Symposium, Lats: 24th IEEE Latin-American Test Symposium (LATS), MAR 21-24, 2023, Veracruz, MEXICO. New York: Ieee. (Latin American Test Workshop).

Ahmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim; (2023). Enhancing Fault Resilience of QNNs by Selective Neuron Splitting. 2023 IEEE 5th International Conference on Artificial Intelligence Circuits and Systems (AICAS): Hangzhou, China, 11-13 June 2023. IEEE, 1−5. DOI: 10.1109/AICAS57966.2023.10168633.

Heidari Iman, Mohammad Reza; Raik, Jaan; Jenihhin, Maksim; Jervan, Gert; Ghasempouri, Tara (2023). An automated method for mining high-quality assertion sets. Microprocessors and Microsystems, 97, #104773. DOI: 10.1016/j.micpro.2023.104773.

Shibin, Konstantin; Auzinger, Georg; Bakhshiansohi, Hamed; Dabrowski, Anne; Dierlamm, Alexander; Dragicevic, Marko; Gholami, Asghar; Gomez, Gervasio; Guthoff, Moritz; Haranko, Mykyta; Honma, Alan; Jenihhin, Maksim; Kaplon, Jan; Karacheban, Olena; Korcsmáros, Berta; Lokhovtskiy, Arkady; Loos, Robert; Mallows, Sophie; Michel, John; Myronenko, Volodymyr ... (2023). Electronics design and testing of the CMS Fast Beam Condition Monitor for HL-LHC. Journal of Physics: Conference Series: 6th Technology & Instrumentation in Particle Physics (TIPP2023), Cape Town, 4-8.09.2023. IOP Publishing, 50−51. DOI: 10.48550/arXiv.2410.14867 [ilmumas].

Rahbari, Dadmehr; Alam, Muhammad Mahtab; Le Moullec, Yannick; Jenihhin, Maksim (2023). Applying RIS-Based Communication for Collaborative Computing in a Swarm of Drones. IEEE Access, 11, 70093−70109. DOI: 10.1109/ACCESS.2023.3293737.

Ahmed, Foisal; Jenihhin, Maksim (2023). Holistic IJTAG-based External and Internal Fault Monitoring in UAVs. 2023 Ieee 24Th Latin American Test Symposium, Lats: 24th IEEE Latin-American Test Symposium (LATS), MAR 21-24, 2023, Veracruz, MEXICO. New York: IEEE, 1−6. (Latin American Test Workshop). DOI: 10.1109/LATS58125.2023.10154489.

Selg, Hardi; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan (2023). ML-Based Online Design Error Localization for RISC-V Implementations. 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS): Crete, Greece, 03-05 July 2023. Ed. Savino, A.; Maniatakos, M.; DiCarlo, S.; Gizopoulos, D. New York: IEEE, 1−7. (IEEE International On-Line Testing Symposium). DOI: 10.1109/IOLTS59296.2023.10224864.

Cherezova, Natalia; Mihhailov, Dmitri; Devadze, Sergei; Jutman, Artur (2022). HLS-based Optimization of Tau Triggering Algorithm for LHC: a case study. 2022 18th Biennial Baltic Electronics Conference (BEC). IEEE, 1−6. DOI: 10.1109/BEC56180.2022.9935599.

Taheri, Mahdi; Riazati, Mohamad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjödin, Mikael; Lisper, Björn (2023). DeepAxe: A Framework for Exploration of Approximation and Reliability Trade-offs in DNN Accelerators. In: 24th International Symposium on Quality Electronic Design (ISQED'23), San Francisco, USA, 5-7 Apr. 2023. (1−8). IEEE. DOI: 10.1109/ISQED57927.2023.10129353.

Taheri, Mahdi; Sheikhpour, Saeideh; Mahani, Ali; Jenihhin, Maksim (2022). A Novel Fault-Tolerant Logic Style with Self-Checking Capability. 2022 Ieee 28Th International Symposium On On-Line Testing And Robust System Design (Iolts 2022): 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), SEP 12-14, 2022, Torino, ITALY. Ed. Savino, A.; Rech, P.; DiCarlo, S.; Gizopoulos, D. New York: IEEE, 1−6. (IEEE International On-Line Testing Symposium). DOI: 10.1109/IOLTS56730.2022.9897818.

Ahmed,Foisal; Jenihhin,Maksim (2023). Holistic IJTAG-based External and Internal Fault Monitoring in UAVs. 2023 IEEE 24th Latin American Test Symposium (LATS): Veracruz, Mexico, 21st - 24th March 2023. IEEE, 1−6. DOI: 10.1109/LATS58125.2023.10154489.

Gursoy, Cemil Cem; Kraak, Daniel; Ahmed, Foisal; Taouil, Mottaqiallah; Jenihhin, Maksim; Hamdioui, Said (2022). On BTI Aging Rejuvenation in Memory Address Decoders. 2022 IEEE 23rd Latin American Test Symposium (LATS). IEEE, 1−6. DOI: 10.1109/LATS57337.2022.9936940.

Tarique, Tanvir Ahmad; Ahmed, Foisal; Jenihhin, Maksim; Ali, Liakot (2022). Unsupervised Recycled FPGA Detection Using Symmetry Analysis. 2022 12th International Conference on Electrical and Computer Engineering (ICECE). IEEE, 437−440. DOI: 10.1109/ICECE57408.2022.10088856.

Nosrati, Nooshin; Jenihhin, Maksim; Navabi, Zainalabedin (2022). MLC: A Machine Learning Based Checker For Soft Error Detection In Embedded Processors. 2022 Ieee 28Th International Symposium On On-Line Testing And Robust System Design (Iolts 2022): 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), SEP 12-14, 2022, Torino, ITALY. Ed. Savino, A.; Rech, P.; DiCarlo, S.; Gizopoulos, D. New York: Ieee. (IEEE International On-Line Testing Symposium).

Oyeniran, Adeboye Stephen; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund (2022). High-Level Fault Diagnosis in RISC Processors with Implementation-Independent Functional Test. 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI): Nicosia, Cyprus, 04-06 July 2022. IEEE, 32−37. DOI: 10.1109/ISVLSI54635.2022.00019.

Ahmed, Foisal; Jenihhin, Maksim (2022). A Survey on UAV Computing Platforms: A Hardware Reliability Perspective. Sensors, 22 (16), 6286. DOI: 10.3390/s22166286.