Tallinna Tehnikaülikool

Töökindla arvutusriistvara keskus

Sisukord

Publikatsioonid

Santhosh, Ashwin; Jutman, Artur; Kaja, Endri; Ecker, Wolfgang; Jenihhin, Maksim (2026). NURSE: A Distributed Architecture for Runtime Fault Management in Processor Designs. 31st IEEE European Test Symposium, Chania Greece, May 25-29, 2026. 31st IEEE European Test Symposium, Chania Greece, May 25-29, 2026, 1−4 [forthcoming].

Taheri, Mahdi; Cherezova, Natalia; Nazari, Samira; Azarpeyvand, Ali; Ghasempouri, Tara; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim (2025). AdAM: Adaptive Approximate Multiplier for Fault Tolerance in DNN Accelerators. IEEE Transactions on Device and Materials Reliability, 25 (1), 66−75. DOI: 10.1109/TDMR.2024.3523386.

Rahbari, Dadmehr; Daneshtalab, Masoud; Jenihhin, Maksim (2025). An Efficient Architecture for Edge AI Federated Learning with Homomorphic Encryption. IEEE Access, 13, 97919−97929. DOI: 10.1109/ACCESS.2025.3576689.

Taheri, Mahdi; Patne, Parth; Cherezova, Natalia; Mahani, Ali; Herglotz, Christian; Jenihhin, Maksim (2025). RL-Agent-based Early-Exit DNN Architecture Search Framework. 2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): Lyon, FRANCE, 05-07 May 2025. Ed. Bosio, A.; Bernardi, P.; Traiola, M.; Mrazek, V. New York: IEEE, 145−148. (IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems). DOI: 10.1109/DDECS63720.2025.11006795.

Kadlecsik, A.; Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A. E.; Delannoy, A. G.; Dalavi, V.; Dienemann, N.; Dragicevic, M.; Garcia, M. F.; Guthoff, M.; Jenihhin, M.; Kaplon, J.; Karacheban, O.; Korcsmaros, B.; Lokhovitskiy, A.; Liu, W. H.; Loos, R.; Mallows, S.; Mihhailov, D.; Obradovic, M. ... Winney, P. D. (2025). Characterization and beam test measurements of CMS Phase-2 luminometers. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators Spectrometers Detectors and Associated Equipment, 1080, ARTN 170663. DOI: 10.1016/j.nima.2025.170663.

Rafiq, Ahsan; Bosio, Alberto; Pappalardo, Salvatore; Jenihhin, Maksim (2025). AxEnMULT: Design of an Efficient and Reliable Approximate Encoding-Based Multiplier. 2025 IEEE Computer Society Annual Symposium on VLSI (ISVLSI): Kalamata, Greece, 06-09 July 2025. IEEE, 1−6. DOI: 10.1109/ISVLSI65124.2025.11130248.

Shibin, K.; Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A.; Dierlamm, A.; Dragicevic, M.; Gholami, A.; Gomez, G.; Guthoff, M.; Haranko, M.; Homna, A.; Jenihhin, M.; Kaplon, J.; Karacheban, O.; Korcsmáros, B.; Lokhovitskiy, A.; Loos, R.; Mallows, S.; Michel, J.; Myronenko, V. ... Wegrzyn, G.J. (2025). Electronics design and testing of the CMS Fast Beam Condition Monitor for HL-LHC. Proceedings of Science, 468: Technology & Instrumentation in Particle Physics (TIPP2023), Cape Town, Western Cape, South Africa, 4 - 8 Sep 2023. Sissa Medialab Srl, ARTN 063. DOI: 10.22323/1.468.0063.

Jutman, A.; Raik, J.; SonzaReorda, M.; Virazel, A.; Voyiatzis, I.; Soudris, D.; Taouil, M.; Lentaris, G.; Jenihhin, M. (2025). ETS 2025 Foreword. Proceedings of the European Test Workshop. Institute of Electrical and Electronics Engineers Inc. DOI: 10.1109/ETS63895.2025.11049597.

Nazari, S.; Taheri, M.; Azarpeyvand, A.; Afsharchi, M.; Herglotz, C.; Jenihhin, M. (2025). GENIE: GENetIc Algorithm-Based REliability Assessment Methodology for Deep Neural Networks. 2025 11th International Conference on Computing and Artificial Intelligence (ICCAI): Kyoto, Japan, 28-31 March 2025. Institute of Electrical and Electronics Engineers Inc, 264−271. DOI: 10.1109/ICCAI66501.2025.00049.

Jenihhin, M.; Raik, J.; Jutman, A.; Cherezova, N.; Ubar, R.; Miclea, L.; Enyedi, S.; Stefan, I.; Stan, O.; Corches, C.; Peng, Z.; Eles, P.; Drechsler, R.; Eggersgluss, S.; Fey, G.; Glowatz, A.; Tille, D.; Gielen, G.; Coyette, A.; Dobbelaere, W. ... Hellebrand, S. (2025). European Test Symposium Teams: an Anniversary Snapshot. 2025 IEEE European Test Symposium (ETS): Tallinn, ESTONIA, 26-30 May 2025. New York: IEEE, 1−48. (Proceedings of the European Test Symposium). DOI: 10.1109/ETS63895.2025.11049652.

Hosseini, M.; Azarpeyvand, A.; Taheri, M.; Ghasempouri, T.; Jenihhin, M. (2025). SHIELD: PSO-Based Hardware Trojan Detection for Efficient and Low-Cost Defense. Proceedings 2025 IEEE 31st International Symposium on on Line Testing and Robust System Design (IOLTS): Ischia, Italy, 07-09 July 2025. Institute of Electrical and Electronics Engineers Inc, 1−6. DOI: 10.1109/IOLTS65288.2025.11116879.

Pappalardo, Salvatore; Bellarmino, Nicolo'; Deveautour, Bastien; Bosio, Alberto; Taheri, Mahdi; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim (2025). SAFFIRA A Framework for Assessing the Reliability of Systolic-Array DNN Accelerators. Journal of Circuits, Systems and Computers, 34 (18), 1-14. DOI: 10.1142/S0218126625430017.

Cherezova, Natalia; Jutman, Artur; Jenihhin, Maksim (2025). FORTALESA: Fault-tolerant reconfigurable systolic array for DNN inference. Microprocessors and Microsystems, 119, 105222. DOI: 10.1016/j.micpro.2025.105222.

Sharifian, Saeed; Taheri, Mahdi; Rashtchi, Vahid; Azarpeyvand, Ali; Herglotz, Christian; Jenihhin, Maksim (2025). Reliability-Aware Hyperparameter Optimization for ANN-to-SNN Conversion. Works in Progress in Embedded Computing Journal WiPiEC Journal, 11 (1), 1−7. DOI: 10.64552/wipiec.v11i1.85.

Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A. E.; Delannoy, A. G.; Dalavi, V.; Dienemann, N.; Dragicevic, M.; Garcia, M. F.; Guthoff, M.; Gyongyosi, B.; Jenihhin, M.; Kadlecsik, A.; Kaplon, J.; Karacheban, O.; Korcsmaros, B.; Lokhovitskiy, A.; Liu, W. H.; Loos, R.; Mallows, S.; Mihhailov, D. ... Winney, P. D. (2025). The CMS Phase-2 Fast Beam Condition Monitor prototype test with beam. Journal of Instrumentation, 20 (11), ARTN P11008. DOI: 10.1088/1748-0221/20/11/P11008.

Rafiq, Ahsan; Jenihhin, Maksim (2025). XMULT: An Energy-Efficient Design of Approximate Multiplier. 2025 55th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W): Naples, Italy, 23-26 June 2025. IEEE , 111−114. DOI: 10.1109/DSN-W65791.2025.00047.

Ahmadilivani, Mohammad Hasan; Kobayashi, Yuto; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim (2025). Does Fault Tolerance Safeguard DNNs Against Bitfiip Attacks? A Case Study. 2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT): Barcelona, Spain, 21-23 October 2025. IEEE, 1−4. DOI: 10.1109/DFT66274.2025.11257506.