Tallinna Tehnikaülikool

Töökindla arvutusriistvara keskus

Sisukord

Publikatsioonid

Santhosh, Ashwin; Jutman, Artur; Kaja, Endri; Ecker, Wolfgang; Jenihhin, Maksim (2026). NURSE: A Distributed Architecture for Runtime Fault Management in Processor Designs. 31st IEEE European Test Symposium, Chania Greece, May 25-29, 2026. 31st IEEE European Test Symposium, Chania Greece, May 25-29, 2026, 1−4 [forthcoming].

Mousavi, Seyedhamidreza; Ahmadilivani, Mohammad Hasan; Raik, Jaan; Jenihhin, Maksim; Daneshtalab, Masoud (2026). Progressive Training of Hybrid Clipped Rectified Linear Unit for Resilient Convolution Neural Networks. IEEE Access, 1−13. DOI: 10.1109/ACCESS.2026.3671327.

Josie E. Rodriguez Condia, Mohammad Hasan Ahmadilivani$, Jaan Raik, Maksim Jenihhin, Matteo Sonza Reorda (2026). FT-Sparse: Algorithm-Based Fault Tolerance for Sparse CNNs Using Structured Sparsity in GPUs. IEEE VLSI Test Symposium (VTS): IEEE, 1−7 [forthcoming].

Mohammad Hasan Ahmadilivani, Josie E. Rodriguez Condia, Maksim Jenihhin, Matteo Sonza Reorda (2026). Investigating the Impact of Soft Errors in GPU-accelerated Sparse DNNs. 2026 IEEE 17th Latin American Circuits and System (LASCAS): Arequipa, Peru, 24-27 February 2026. IEEE, 1−5. DOI: 10.1109/LASCAS67804.2026.11457175.

Mohammad Hasan Ahmadilivani, Natalia Cherezova, Michael Glaß, Juan-David Guerrero-Balaguera, Maksim Jenihhin, Angeliki Kritikakou, Robert Limas Sierra, Leticia Bolzani Poelhs, Jaan Raik, Lucas Roquet, Fernando Fernandes dos Santos, Felipe Augusto da Silva, Matteo Sonza Reorda, Alessandro Veronesi, Ernesto Cristopher Villegas Castillo, Josie E. Rodriguez Condia (2026). Reliability Assessment of Deep Neural Networks and Accelerators Across Design Stages. IEEE Latin American Test Symposium (LATS): IEEE, 1−10 [forthcoming].

Cherezova, N.; Pappalardo, S.; Ruospo, A.; Deveautour, B.; Fezza, L.; Jutman, A.; Sanchez, E.; Bosio, A.; Reorda, M.S.; Jenihhin, M. (2026). Special Session: Reliability Assessment of DNN Models and Inference on Systolic Arrays. Proceedings of the IEEE VLSI Test Symposium. IEEE Computer Society. DOI: 10.1109/VTS69484.2026.11563366.

Jenihhin, M.; Taheri, M.; Cherezova, N. (2026). Quantization-Aided Cost-Efficient Reliability of CNN Accelerators for Edge AI. In: Shanshan Liu, Pedro Reviriego, Zhen Gao, Fabrizio Lombardi (Ed.). Machine Learning Systems. (255−283). Springer Cham. DOI: 10.1007/978-3-032-17948-7_9.

Cherezova, N.; Ahmadilivani, M.H.; Raik, J.; Daneshtalab, M.; Jenihhin, M. (2026). Can Model-Level Fault Tolerance be Enough for DNN Hardware Accelerators? A Study. IEEE Design and Test. DOI: 10.1109/MDAT.2026.3686087.

Taheri, Mahdi; Cherezova, Natalia; Nazari, Samira; Azarpeyvand, Ali; Ghasempouri, Tara; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim (2025). AdAM: Adaptive Approximate Multiplier for Fault Tolerance in DNN Accelerators. IEEE Transactions on Device and Materials Reliability, 25 (1), 66−75. DOI: 10.1109/TDMR.2024.3523386.

Rahbari, Dadmehr; Daneshtalab, Masoud; Jenihhin, Maksim (2025). An Efficient Architecture for Edge AI Federated Learning with Homomorphic Encryption. IEEE Access, 13, 97919−97929. DOI: 10.1109/ACCESS.2025.3576689.

Taheri, Mahdi; Patne, Parth; Cherezova, Natalia; Mahani, Ali; Herglotz, Christian; Jenihhin, Maksim (2025). RL-Agent-based Early-Exit DNN Architecture Search Framework. 2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): Lyon, FRANCE, 05-07 May 2025. Ed. Bosio, A.; Bernardi, P.; Traiola, M.; Mrazek, V. New York: IEEE, 145−148. (IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems). DOI: 10.1109/DDECS63720.2025.11006795.

Kadlecsik, A.; Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A. E.; Delannoy, A. G.; Dalavi, V.; Dienemann, N.; Dragicevic, M.; Garcia, M. F.; Guthoff, M.; Jenihhin, M.; Kaplon, J.; Karacheban, O.; Korcsmaros, B.; Lokhovitskiy, A.; Liu, W. H.; Loos, R.; Mallows, S.; Mihhailov, D.; Obradovic, M. ... Winney, P. D. (2025). Characterization and beam test measurements of CMS Phase-2 luminometers. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators Spectrometers Detectors and Associated Equipment, 1080, ARTN 170663. DOI: 10.1016/j.nima.2025.170663.

Rafiq, Ahsan; Bosio, Alberto; Pappalardo, Salvatore; Jenihhin, Maksim (2025). AxEnMULT: Design of an Efficient and Reliable Approximate Encoding-Based Multiplier. 2025 IEEE Computer Society Annual Symposium on VLSI (ISVLSI): Kalamata, Greece, 06-09 July 2025. IEEE, 1−6. DOI: 10.1109/ISVLSI65124.2025.11130248.

Shibin, K.; Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A.; Dierlamm, A.; Dragicevic, M.; Gholami, A.; Gomez, G.; Guthoff, M.; Haranko, M.; Homna, A.; Jenihhin, M.; Kaplon, J.; Karacheban, O.; Korcsmáros, B.; Lokhovitskiy, A.; Loos, R.; Mallows, S.; Michel, J.; Myronenko, V. ... Wegrzyn, G.J. (2025). Electronics design and testing of the CMS Fast Beam Condition Monitor for HL-LHC. Proceedings of Science, 468: Technology & Instrumentation in Particle Physics (TIPP2023), Cape Town, Western Cape, South Africa, 4 - 8 Sep 2023. Sissa Medialab Srl, ARTN 063. DOI: 10.22323/1.468.0063.

Jutman, A.; Raik, J.; SonzaReorda, M.; Virazel, A.; Voyiatzis, I.; Soudris, D.; Taouil, M.; Lentaris, G.; Jenihhin, M. (2025). ETS 2025 Foreword. Proceedings of the European Test Workshop. Institute of Electrical and Electronics Engineers Inc. DOI: 10.1109/ETS63895.2025.11049597.

Nazari, S.; Taheri, M.; Azarpeyvand, A.; Afsharchi, M.; Herglotz, C.; Jenihhin, M. (2025). GENIE: GENetIc Algorithm-Based REliability Assessment Methodology for Deep Neural Networks. 2025 11th International Conference on Computing and Artificial Intelligence (ICCAI): Kyoto, Japan, 28-31 March 2025. Institute of Electrical and Electronics Engineers Inc, 264−271. DOI: 10.1109/ICCAI66501.2025.00049.

Jenihhin, M.; Raik, J.; Jutman, A.; Cherezova, N.; Ubar, R.; Miclea, L.; Enyedi, S.; Stefan, I.; Stan, O.; Corches, C.; Peng, Z.; Eles, P.; Drechsler, R.; Eggersgluss, S.; Fey, G.; Glowatz, A.; Tille, D.; Gielen, G.; Coyette, A.; Dobbelaere, W. ... Hellebrand, S. (2025). European Test Symposium Teams: an Anniversary Snapshot. 2025 IEEE European Test Symposium (ETS): Tallinn, ESTONIA, 26-30 May 2025. New York: IEEE, 1−48. (Proceedings of the European Test Symposium). DOI: 10.1109/ETS63895.2025.11049652.

Hosseini, M.; Azarpeyvand, A.; Taheri, M.; Ghasempouri, T.; Jenihhin, M. (2025). SHIELD: PSO-Based Hardware Trojan Detection for Efficient and Low-Cost Defense. Proceedings 2025 IEEE 31st International Symposium on on Line Testing and Robust System Design (IOLTS): Ischia, Italy, 07-09 July 2025. Institute of Electrical and Electronics Engineers Inc, 1−6. DOI: 10.1109/IOLTS65288.2025.11116879.

Pappalardo, Salvatore; Bellarmino, Nicolo'; Deveautour, Bastien; Bosio, Alberto; Taheri, Mahdi; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim (2025). SAFFIRA A Framework for Assessing the Reliability of Systolic-Array DNN Accelerators. Journal of Circuits, Systems and Computers, 34 (18), 1-14. DOI: 10.1142/S0218126625430017.

Cherezova, Natalia; Jutman, Artur; Jenihhin, Maksim (2025). FORTALESA: Fault-tolerant reconfigurable systolic array for DNN inference. Microprocessors and Microsystems, 119, 105222. DOI: 10.1016/j.micpro.2025.105222.

Sharifian, Saeed; Taheri, Mahdi; Rashtchi, Vahid; Azarpeyvand, Ali; Herglotz, Christian; Jenihhin, Maksim (2025). Reliability-Aware Hyperparameter Optimization for ANN-to-SNN Conversion. Works in Progress in Embedded Computing Journal WiPiEC Journal, 11 (1), 1−7. DOI: 10.64552/wipiec.v11i1.85.

Auzinger, G.; Bakhshiansohi, H.; Dabrowski, A. E.; Delannoy, A. G.; Dalavi, V.; Dienemann, N.; Dragicevic, M.; Garcia, M. F.; Guthoff, M.; Gyongyosi, B.; Jenihhin, M.; Kadlecsik, A.; Kaplon, J.; Karacheban, O.; Korcsmaros, B.; Lokhovitskiy, A.; Liu, W. H.; Loos, R.; Mallows, S.; Mihhailov, D. ... Winney, P. D. (2025). The CMS Phase-2 Fast Beam Condition Monitor prototype test with beam. Journal of Instrumentation, 20 (11), ARTN P11008. DOI: 10.1088/1748-0221/20/11/P11008.

Rafiq, Ahsan; Jenihhin, Maksim (2025). XMULT: An Energy-Efficient Design of Approximate Multiplier. 2025 55th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W): Naples, Italy, 23-26 June 2025. IEEE , 111−114. DOI: 10.1109/DSN-W65791.2025.00047.

Ahmadilivani, Mohammad Hasan; Kobayashi, Yuto; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, Maksim (2025). Does Fault Tolerance Safeguard DNNs Against Bitfiip Attacks? A Case Study. 2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT): Barcelona, Spain, 21-23 October 2025. IEEE, 1−4. DOI: 10.1109/DFT66274.2025.11257506.